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High Resolution X-ray Diffractometry and Topography

By: Bowen, D.K. (University of Durham)Contributor(s): Tanner, B.K. (University of Warwick)Material type: TextTextReference number:i0850667585Publication details: London Taylor & Francis Books Ltd 1998 Description: 264 p. hardbackISBN: 0850667585Subject(s): X-ray crystallography | X-rays - Diffraction | CrystalsLOC classification: QD945.B683
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Item type Current library Class number Copy number Status Date due Barcode Item reservations
Standard Standard Main Library General Shelves QD945 .B683 (Browse shelf(Opens below)) 1 Available 304156-1001
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