TY  - BOOK
AU  - Dressendorfer, P.V. (Sandia National Laboratories, Alberquerque, New Mexico, USA)
AU  - Ma, T.-P. (Yale University, USA)
TI  - Ionizing Radiation Effects in MOS Devices and Circuits
SN  - 047184893X
AV  - TK7871.85 
PY  - 1989///
CY  - New York
PB  - John Wiley and Sons Ltd
KW  - Metal oxide semiconductors - Effect of radiation on
N1  - BookData Record
ER  -