TY  - BOOK
AU  - Amerasekera, A.
AU  - Najim, F. (University of Illinois, Urbana-Champaign, USA)
TI  - Failure Mechanisms in Semiconductor Devices
SN  - 0471954829
AV  - TK7871.852 
PY  - 1997///
CY  - Chichester
PB  - John Wiley and Sons Ltd
KW  - Semiconductors - Failures
N1  - BookData Record
ER  -