000 00520cam a2200205 4500
001 i0471607118
020 _a0471607118
035 _a(Sirsi) i9780471607113
050 _aQD945
100 _a(University of Washington, USA)
245 _aX-ray Structure Determination
260 _aNew York
_bJohn Wiley and Sons Ltd
_c1989
300 _a472 p.
_ehardback.
250 _a2nd ed
500 _aBookData Record
650 _aX-ray crystallography.
700 _aJensen, L.H.
700 _aStout, G.H.
596 _a1
999 _c43643
_d43643