| 000 | 00592cam a2200205 4500 | ||
|---|---|---|---|
| 001 | i0850667585 | ||
| 020 | _a0850667585 | ||
| 035 | _a(Sirsi) i9780850667585 | ||
| 050 | _aQD945.B683 | ||
| 100 | _aBowen, D.K. (University of Durham) | ||
| 245 | _aHigh Resolution X-ray Diffractometry and Topography | ||
| 260 |
_aLondon _bTaylor & Francis Books Ltd _c1998 |
||
| 300 |
_a264 p. _ehardback. |
||
| 500 | _aBookData Record | ||
| 650 | _aX-ray crystallography. | ||
| 650 | _aX-rays - Diffraction. | ||
| 650 | _aCrystals. | ||
| 700 | _aTanner, B.K. (University of Warwick) | ||
| 596 | _a1 | ||
| 999 |
_c44031 _d44031 |
||