| 000 | 00546cam a2200193 4500 | ||
|---|---|---|---|
| 001 | i0471954829 | ||
| 020 | _a0471954829 | ||
| 035 | _a(Sirsi) i9780471954828 | ||
| 050 | _aTK7871.852 | ||
| 100 | _aAmerasekera, A. | ||
| 245 | _aFailure Mechanisms in Semiconductor Devices | ||
| 260 |
_aChichester _bJohn Wiley and Sons Ltd _c1997 |
||
| 300 |
_a358 p. _ehardback. |
||
| 250 | _a2nd ed | ||
| 500 | _aBookData Record | ||
| 650 | _aSemiconductors - Failures. | ||
| 700 | _aNajim, F. (University of Illinois, Urbana-Champaign, USA) | ||
| 596 | _a1 | ||
| 999 |
_c44696 _d44696 |
||