Ionizing Radiation Effects in MOS Devices and Circuits (Record no. 43711)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00598cam a2200181 4500 |
| 001 - CONTROL NUMBER | |
| control field | i047184893X |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 047184893X |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (Sirsi) i9780471848936 |
| 050 ## - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | TK7871.85 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Dressendorfer, P.V. (Sandia National Laboratories, Alberquerque, New Mexico, USA) |
| 245 ## - TITLE STATEMENT | |
| Title | Ionizing Radiation Effects in MOS Devices and Circuits |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc | New York |
| Name of publisher, distributor, etc | John Wiley and Sons Ltd |
| Date of publication, distribution, etc | 1989 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 592 p. |
| Accompanying material | hardback. |
| 500 ## - GENERAL NOTE | |
| General note | BookData Record |
| 596 ## - | |
| -- | 1 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Metal oxide semiconductors - Effect of radiation on. |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Ma, T.-P. (Yale University, USA) |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Copy number | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Library of Congress Classification | Main Library | Main Library | General Shelves | TK7871.85 | 302556-1001 | 03/01/2009 | 1 | 03/01/2009 | Standard |