Amazon cover image
Image from Amazon.com

Ionizing Radiation Effects in MOS Devices and Circuits

By: Dressendorfer, P.V. (Sandia National Laboratories, Alberquerque, New Mexico, USA)Contributor(s): Ma, T.-P. (Yale University, USA)Material type: TextTextReference number:i047184893XPublication details: New York John Wiley and Sons Ltd 1989 Description: 592 p. hardbackISBN: 047184893XSubject(s): Metal oxide semiconductors - Effect of radiation onLOC classification: TK7871.85
Reviews from LibraryThing.com:
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)